3D confocal microscope

Additional Details

Observation with a clear and flare-less erect image and a wide field of view • Measuring accuracy that is the highest in its class (and conforms to JIS B 7153) • Proven high-NA objectives from the FS optical system (long working distance type) • Integration of metallurgical and measurement microscope functions provides high-resolution observation and high-accuracy measurement solution • Illumination unit (reflected/transmitted) selectable from a high-intensity LED or halogen bulb (required)Variable aperture diaphragm (reflected/ transmitted) allows observation measurement while suppressing light diffraction • Variety of standardized stages in sizes up to 400 × 200 mm • Quick-release mechanism useful for moving the stage quickly when measuring workpieces that are large in size or quantity • High-magnification eyepiece observation up to 4000X • Low-noise design Technical Data Observation image: Erect image Optical tube: Siedentoph type (pupil distance adjustment: 51 - 76mm), 1X tube lens, Binocular tube (depression: 30), Reticle projection method, with TV mount, Optical path ratio (eyepiece/ TV mount: 50/50) Eyepiece lens: 10X (field No.: 24mm), Optional: 15X, 20X Turret (optional): Manual or power Objective (optional): M / BD Plan Apo objective from 1X to 100X (Refer to page J-36 for more details.) Transmitted illumination • Light source: Halogen bulb (12V, 50W) Optical system: Telecentric illumination with adjustable aperture diaphragms • Functions: Light intensity adjustable, Nonstepped brightness adjustment Surface illumination • Light source: Optional halogen illumination uniObservation with a clear and flare-less erect image and a wide field of view • Measuring accuracy that is the highest in its class (and conforms to JIS B 7153) • Proven high-NA objectives from the FS optical system (long working distance type) • Integration of metallurgical and measurement microscope functions provides high-resolution observation and high-accuracy measurement solution • Illumination unit (reflected/transmitted) selectable from a high-intensity LED or halogen bulb (required)Variable aperture diaphragm (reflected/ transmitted) allows observation measurement while suppressing light diffraction • Variety of standardized stages in sizes up to 400 × 200 mm • Quick-release mechanism useful for moving the stage quickly when measuring workpieces that are large in size or quantity • High-magnification eyepiece observation up to 4000X • Low-noise design Technical Data Observation image: Erect image Optical tube: Siedentoph type (pupil distance adjustment: 51 - 76mm), 1X tube lens, Binocular tube (depression: 30), Reticle projection method, with TV mount, Optical path ratio (eyepiece/ TV mount: 50/50) Eyepiece lens: 10X (field No.: 24mm), Optional: 15X, 20X Turret (optional): Manual or power Objective (optional): M / BD Plan Apo objective from 1X to 100X (Refer to page J-36 for more details.) Transmitted illumination • Light source: Halogen bulb (12V, 50W) Optical system: Telecentric illumination with adjustable aperture diaphragms • Functions: Light intensity adjustable, Nonstepped brightness adjustment Surface illumination • Light source: Optional halogen illumination uniObservation with a clear and flare-less erect image and a wide field of view • Measuring accuracy that is the highest in its class (and conforms to JIS B 7153) • Proven high-NA objectives from the FS optical system (long working distance type) • Integration of metallurgical and measurement microscope functions provides high-resolution observation and high-accuracy measurement solution • Illumination unit (reflected/transmitted) selectable from a high-intensity LED or halogen bulb (required)Variable aperture diaphragm (reflected/ transmitted) allows observation measurement while suppressing light diffraction • Variety of standardized stages in sizes up to 400 × 200 mm • Quick-release mechanism useful for moving the stage quickly when measuring workpieces that are large in size or quantity • High-magnification eyepiece observation up to 4000X • Low-noise design Technical Data Observation image: Erect image Optical tube: Siedentoph type (pupil distance adjustment: 51 - 76mm), 1X tube lens, Binocular tube (depression: 30), Reticle projection method, with TV mount, Optical path ratio (eyepiece/ TV mount: 50/50) Eyepiece lens: 10X (field No.: 24mm), Optional: 15X, 20X Turret (optional): Manual or power Objective (optional): M / BD Plan Apo objective from 1X to 100X (Refer to page J-36 for more details.) Transmitted illumination • Light source: Halogen bulb (12V, 50W) Optical system: Telecentric illumination with adjustable aperture diaphragms • Functions: Light intensity adjustable, Nonstepped brightness adjustment Surface illumination • Light source: Optional halogen illumination uniObservation with a clear and flare-less erect image and a wide field of view • Measuring accuracy that is the highest in its class (and conforms to JIS B 7153) • Proven high-NA objectives from the FS optical system (long working distance type) • Integration of metallurgical and measurement microscope functions provides high-resolution observation and high-accuracy measurement solution • Illumination unit (reflected/transmitted) selectable from a high-intensity LED or halogen bulb (required)Variable aperture diaphragm (reflected/ transmitted) allows observation measurement while suppressing light diffraction • Variety of standardized stages in sizes up to 400 × 200 mm • Quick-release mechanism useful for moving the stage quickly when measuring workpieces that are large in size or quantity • High-magnification eyepiece observation up to 4000X • Low-noise design Technical Data Observation image: Erect image Optical tube: Siedentoph type (pupil distance adjustment: 51 - 76mm), 1X tube lens, Binocular tube (depression: 30), Reticle projection method, with TV mount, Optical path ratio (eyepiece/ TV mount: 50/50) Eyepiece lens: 10X (field No.: 24mm), Optional: 15X, 20X Turret (optional): Manual or power Objective (optional): M / BD Plan Apo objective from 1X to 100X (Refer to page J-36 for more details.) Transmitted illumination • Light source: Halogen bulb (12V, 50W) Optical system: Telecentric illumination with adjustable aperture diaphragms • Functions: Light intensity adjustable, Nonstepped brightness adjustment Surface illumination • Light source: Optional halogen illumination uniObservation with a clear and flare-less erect image and a wide field of view • Measuring accuracy that is the highest in its class (and conforms to JIS B 7153) • Proven high-NA objectives from the FS optical system (long working distance type) • Integration of metallurgical and measurement microscope functions provides high-resolution observation and high-accuracy measurement solution • Illumination unit (reflected/transmitted) selectable from a high-intensity LED or halogen bulb (required)Variable aperture diaphragm (reflected/ transmitted) allows observation measurement while suppressing light diffraction • Variety of standardized stages in sizes up to 400 × 200 mm • Quick-release mechanism useful for moving the stage quickly when measuring workpieces that are large in size or quantity • High-magnification eyepiece observation up to 4000X • Low-noise design Technical Data Observation image: Erect image Optical tube: Siedentoph type (pupil distance adjustment: 51 - 76mm), 1X tube lens, Binocular tube (depression: 30), Reticle projection method, with TV mount, Optical path ratio (eyepiece/ TV mount: 50/50) Eyepiece lens: 10X (field No.: 24mm), Optional: 15X, 20X Turret (optional): Manual or power Objective (optional): M / BD Plan Apo objective from 1X to 100X (Refer to page J-36 for more details.) Transmitted illumination • Light source: Halogen bulb (12V, 50W) Optical system: Telecentric illumination with adjustable aperture diaphragms • Functions: Light intensity adjustable, Nonstepped brightness adjustment Surface illumination • Light source: Optional halogen illumination uni